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Rocky Mountain Environmental X-Ray Photoelectron Spectroscopy

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Primary Contact:

Xerxes Steirer

Last Updated: More than One Year ago

Facility RRID

RRID:SCR_022050

Facility Details

XPS measures material surface compositions by measuring the intensity of photoelectrons emitted as a function of the incident X-ray energy. Spectra features are used to identify the surface species present and calculate the fraction of the surface occupied by each.
The Rocky Mountain E-XPS extends these traditional capabilities by enabling measurements in a range of environmental conditions.