Sign In

Search |

Add/Edit My Facility

Time of Flight - Secondary Ion Mass Spectrometry

Subscribe to this Core


Facility Address

Colorado School of Mines

1500 Illinois Street

Golden, CO 80401

United States

https://www.mines.edu/shared-facilities/instruments/#clean

Google Maps Location

cite this facility

Primary Contact:

Michael Walker

Facility RRID

RRID:SCR_022049

Facility Details

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly surface-sensitive analytical technique used to obtain elemental, isotopic, and molecular information from the surface of solid materials and compacted powders.

Facility Policies

Services are offerred outside of

Consulting is offerred outside of Colorado School of Mines

Last Updated: 09/17/2026