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All Facilities >> Colorado School of Mines >> Time of Flight - Secondary Ion Mass Spectrometry
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Colorado School of Mines
United States of AmericaMichael Walker
Last Updated: More than One Year ago
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly surface-sensitive analytical technique used to obtain elemental, isotopic, and molecular information from the surface of solid materials and compacted powders.
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https://coremarketplace.org/?FacilityID=1328Keywords:
USEDit, ABRF
Resource Type:
Resource, service resource, core facility, access service resource
Citation:
Colorado School of Mines Shared Instrumentation Facility Time of Flight Secondary Ion Mass Spectrometry Core Facility (RRID:SCR_022049)
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