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Time of Flight - Secondary Ion Mass Spectrometry

Colorado School of Mines

United States of America

https://www.mines.edu/shared-facilities/instruments/#clean

Primary Contact:

Michael Walker

Last Updated: More than One Year ago

Facility RRID

RRID:SCR_022049

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Facility Details

Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly surface-sensitive analytical technique used to obtain elemental, isotopic, and molecular information from the surface of solid materials and compacted powders.