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UA CBC Laboratory for Electron Spectroscopy and Surface Analysis (LESSA) Facility
A photoelectron spectroscopy and thin-film deposition facility supporting thin-film design, growth and analysis research programs.
Services are offerred outside of University of Arizona
Consulting is not offerred outside of University of Arizona
No additional equipment has been listed
Publications associated with this facility (Click To View):
1.) Du Hill L, De Keersmaecker M, Colbert AE, Hill JW, Placencia D, Boercker JE, Armstrong NR, Ratcliff EL (2022 Jan 4). Rationalizing energy level alignment by characterizing Lewis acid/base and ionic interactions at printable semiconductor/ionic liquid interfaces. Materials horizons, 9(1), 471-481. doi: 10.1039/d1mh01306h. ID: 34859805.
2.) Placencia D, Lee P, Tischler JG, Ratcliff EL (2018 Aug 1). Energy Level Alignment of Molybdenum Oxide on Colloidal Lead Sulfide (PbS) Thin Films for Optoelectronic Devices. ACS applied materials & interfaces, 10(30), 24981-24986. doi: 10.1021/acsami.8b07651. ID: 30014689.
3.) Steirer KX, Ou KL, Armstrong NR, Ratcliff EL (2017 Sep 13). Critical Interface States Controlling Rectification of Ultrathin NiO-ZnO p-n Heterojunctions. ACS applied materials & interfaces, 9(36), 31111-31118. doi: 10.1021/acsami.7b08899. ID: 28832121.
4.) Ratcliff EL, Shallcross RC, Armstrong NR (2016 Nov 9). Introduction: Electronic Materials. Chemical reviews, 116(21), 12821-12822. . ID: 27933777.
5.) Shallcross RC, Stubhan T, Ratcliff EL, Kahn A, Brabec CJ, Armstrong NR (2015 Apr 16). Quantifying the Extent of Contact Doping at the Interface between High Work Function Electrical Contacts and Poly(3-hexylthiophene) (P3HT). The journal of physical chemistry letters, 6(8), 1303-9. doi: 10.1021/acs.jpclett.5b00444. ID: 26263127.
6.) Matz DL, Ratcliff EL, Meyer J, Kahn A, Pemberton JE (2013 Jul 10). Deciphering the metal-C60 interface in optoelectronic devices: evidence for C60 reduction by vapor deposited Al. ACS applied materials & interfaces, 5(13), 6001-8. doi: 10.1021/am400640x. ID: 23734813.
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