Facility Details

Facility is equipped with JEOL JXA-8230 SuperProbe electron microprobe. Electron microprobe measures elemental compositions of solid samples by detecting the X-rays emitted on excitation by focused electron beam, down to spatial resolution of about 1 micron. All elements heavier than beryllium can be detected, at concentrations as low as 10s of ppm. Highly quantitative analyses are made using 5 wavelength dispersive X-ray spectrometers (WDS) with calibrations based on known standard materials. Compositional images (maps) can readily be obtained with backscattered electrons (sensitive primarily to mean atomic number), or with WDS or EDS X-ray data. The instrument is adjacent to the Stanford Nanocharacterization Laboratory (SNL), at the west end of the first floor of the McCullough Building.