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University of Delaware
Department of Chemistry & Biochemistry
023 Lammot DuPont Laboratory
Newark, DE 19716
United States of Americahttp://www.udel.edu/chem/beebe/surface.htmThomas P Beebe Jr
Last Updated: 06/30/2012
Consulting and services in X-ray Photoelectron Spectroscopy (XPS, also called ESCA), Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), Atomic Force Microscopy (AFM)
Services are offerred outside of University of Delaware
X-ray Photoelectron Spectroscopy (XPS, also called ESCA), Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), Atomic Force Microscopy (AFM)
No publications have been associated with this facility
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https://coremarketplace.org/?FacilityID=439Keywords:
Surface, analysis, X-ray, photoelectron, spectroscopy, ion, mass, spectrometry, imaging, Auger, microscopy, scattering, scanning, probe, service, core
Resource Type:
Resource, service resource, core facility, access service resource
Citation:
Delaware University Surface Analysis Core Facility (RRID:SCR_017796)
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Facility Details
About This Facility
Services and Equipment
Publications
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Metadata
