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Surface Analysis Facility

University of Delaware

Department of Chemistry & Biochemistry

023 Lammot DuPont Laboratory

Newark, DE 19716

United States of America

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Primary Contact:

Thomas P Beebe Jr

Last Updated: 06/30/2012

Facility RRID


Facility Details

Consulting and services in X-ray Photoelectron Spectroscopy (XPS, also called ESCA), Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), Atomic Force Microscopy (AFM)

Facility Policies

Services are offerred outside of University of Delaware