The CoreMarketplace: LUME

Universidad Nacional Autónoma de México

Circuito Exterior S/N, Circuito de la Investigación Científica

Mexico City,

04510

Mexico

https://www.iim.unam.mx/lablume/inicio.html

cite this facility

Quicklinks:

https://coremarketplace.org/LUME https://coremarketplace.org/RRID:SCR_024400

Facility LIMS Page

https://www.iim.unam.mx/lablume/equipos-1.html

Primary Contact:

LUME

Last Updated: 09/01/2023

Facility RRID

RRID:SCR_024400

Facility Details

The LUME covers the main techniques of electron microscopy, from scanning electron microscopy (SEM) to scanning transmission electron microscopy (STEM), for the characterization of the morphology and structure of materials at the micrometer and nanometer scale. In addition, it has equipment for preparing samples for analysis by different electron microscopy techniques.

Facility Policies

Services are offerred outside of Universidad Nacional Autónoma de México

Consulting is offerred outside of Universidad Nacional Autónoma de México

Services offered:

Electron Microscopy

Focused Ion Beam (FIB)

Microscopy

Scanning Electron Microscopy

Transmission Electron Microscopy

Facility Equipment

JEOL JEM 9320FIB

JEOL JEOL 7600F

A semi in-lens SEM with high resolution. The adoption of a High Power Optics irradiation system delivers high-resolution, high-speed, high-accuracy element analysis. The incorporation of the Gentle Beam enables top-surface imaging of a specimen at very low energies of several hundred eV.

JEOL JEOL ARM200F

JEM-ARM200F ACCELARM is an Atomic Resolution Analytical Electron Microscope, which boasts an unprecedented STEM-HAADF resolution of 78 pm with a STEM Cs corrector incorporated as standard.

No additional equipment has been listed

Publications

No publications have been associated with this facility

Associations

Metadata

Links

All the links listed resolve to this core profile

https://coremarketplace.org/?FacilityID=1826
https://coremarketplace.org/RRID:SCR_024400

Institution

Institution ROR ID: https://ror.org/01tmp8f25

SciCrunch Data Imports (data maintained by https://scicrunch.org)

Keywords:

USEDit, ABRF, electron microscopy, scanning electron microscopy, scanning transmission electron microscopy, materials characterization, materials morphology, materials structure, micrometer and nanometer scale

Resource Type:

service resource, access service resource, core facility

Citation:

National Autonomous University of Mexico Materials Research Institute Electron Microscopy University Laboratory Core Facility (RRID:SCR_024400)

LUME (Materials Characterization)

Quicklinks:

Facility LIMS Page

Primary Contact:

Facility RRID

Facility Details

Facility Policies

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Services offered:

Facility Equipment

(To see more facility information, click the in the upper right)

Publications

(To see more facility information, click the in the upper right)

Associations

(To see more facility information, click the in the upper right)

Metadata

SciCrunch Data Imports (data maintained by https://scicrunch.org)

(To see more facility information, click the in the upper right)

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LUME

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