Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a highly surface-sensitive analytical technique used to obtain elemental, isotopic, and molecular information from the surface of solid materials and compacted powders.

Liquid Chromatography-Mass Spectrometry is an analytical technique for determining an ion’s mass-to-charge ratio by partitioning the particles within a liquid and measuring the time it takes for each particle to travel through a selected mobile phase. Ultimately this helps in determining the contents of a liquid sample and can be used to analyze biochemical, organic and inorganic compounds.

The Mechanical Testing labs include a variety of monotonic, fatigue, temperature, and strain measurement capabilities. These capabilities cover a wide range of load capacities and resolutions, displacement rates, loading configurations, and custom fixturing.

This facility houses cleanrooms with processing equipment for making and characterizing electronic devices, thin film deposition tools for the creation of metallic and ceramic thin film devices, and a characterization lab with tools for the surface, morphological, and optical characterization of materials.

Core facility houses the capability to test water using multiple instruments and techniques including : Ion Chromatography, which is an analytical technique for determining the concentration of anions in aqueous solutions such as fluoride, chloride, nitrate, phosphate and sulfate; Carbon and nitrogen analysis, which incorporates measurements of total carbon, total inorganic carbon and total organic carbon together with total nitrogen; and other parameters such as pH, alkalinity, turbidity, conductivity (and others) using instrumentation and kits.

Core to capture mass spectral data obtained through time-of-flight measurements that can be used for 3D nanoscale compositional analysis to identify light mass and heavy mass species with equivalent sensitivity.

This facility provides SEM, FIB, TEM, scanning probe, and optical techniques for analyzing materials.

XPS measures material surface compositions by measuring the intensity of photoelectrons emitted as a function of the incident X-ray energy. Spectra features are used to identify the surface species present and calculate the fraction of the surface occupied by each.
The Rocky Mountain E-XPS extends these traditional capabilities by enabling measurements in a range of environmental conditions.

This facility encompasses X-ray diffraction, providing crystallographic, structural, and compositional information, and X-ray tomography, enabling nondestructive tomographic imaging and grain reconstruction used to distinguish between phases, identify defects, and provide 3D crystallographic grain reconstructions.