University of Florida
Gary Scheiffele
1041 Center Drive
Gainesville, FL 32611
https://nrf.aux.eng.ufl.edu
RRID: RRID:SCR_025135
FEI Themis Z for Materials Science
Next generation, ultra-high resolution, aberration corrected, scanning transmission electron microscope delivering the ultimate optical performance and flexibility with unprecedented reproducibility. [Product Link]
RRID:SCR_019910
Waygate Phoenix v|tome|x m
Dual Tube Micro CT
Zeiss Versa 620 XRM
X-Ray microscope with diffraction contrast tomography option
3D Visualization
Annealing Furnace
Atomic Layer Deposition
Computed Tomography (CT)
Contact Angle Measurement
Differential Interference Contrast Microscopy
Dynamic Light Scattering
EDS - Energy Dispersive X-ray Spectrometry
Electron Beam Lithography
Electron Microscopy
Electronic Medical Device Prototyping
Ellipsometry
Etching
Focused Ion Beam (FIB)
FT-IR
Light Scattering
Lyophilization
MicroCT
Microscopy
Microstructure Characterization
Raman Spectroscopy
Rheology
Scanning Electron Microscopy
Spectroscopy
Surface Roughness
Transmission Electron Microscopy
UV-Vis Spectroscopy
Wafer Bonding
Wafer Dicing
Wire Bonding
X-ray Diffraction and Scattering
Zeta Potential
1.) Mirmahdi RS, Dicker SL, Yusuf NG, Montazeri N (2025 Mar 8). Navigating Uncertainties in RT-qPCR and Infectivity Assessment of Norovirus Food and Environmental Virology, 17(1), 22. . PMCID: 11890344.
2.) Schachner ER, Moore AJ (2025 Feb 27). Unidirectional airflow, air sacs or the horizontal septum: what does it take to make a bird lung? Philosophical Transactions of the Royal Society B: Biological Sciences, 380(1920), 20230418. . PMCID: 11864838.
3.) Moore AJ, Schachner ER (2025 Feb 27). When the lung invades: a review of avian postcranial skeletal pneumaticity Philosophical Transactions of the Royal Society B: Biological Sciences, 380(1920), rstb.2023.0427. . PMCID: 12077225.
Electron microscopy and analysis (SEM, TEM, FIB, EBSD, WDS), microelectronic device fabrication (7000 sq ft cleanroom, Class 100-1000), X-ray computed tomography (CT), particle system characterization (size, zeta potential, surface area, porosity, rheology), X-ray diffraction, surface analysis (AFM, profilometry, XPS, Auger), spectroscopy (UV/Vis with integrating sphere, FTIR/NIR with micro capability and micro-Raman).
