University of Florida
Contact Info:
Gary Scheiffele
1041 Center Drive
Gainesville, FL 32611
Grants and Identifiers:
RRID: RRID:SCR_025135
Instrumentation:
Services Provided:
Differential Interference Contrast Microscopy
EDS - Energy Dispersive X-ray Spectrometry
Electronic Medical Device Prototyping
Microstructure Characterization
Transmission Electron Microscopy
X-ray Diffraction and Scattering
Relevant Publications:
Description:
Electron microscopy and analysis (SEM, TEM, FIB, EBSD, WDS), microelectronic device fabrication (7000 sq ft cleanroom, Class 100-1000), X-ray computed tomography (CT), particle system characterization (size, zeta potential, surface area, porosity, rheology), X-ray diffraction, surface analysis (AFM, profilometry, XPS, Auger), spectroscopy (UV/Vis with integrating sphere, FTIR/NIR with micro capability and micro-Raman).