A semi in-lens SEM with high resolution. The adoption of a High Power Optics irradiation system delivers high-resolution, high-speed, high-accuracy element analysis. The incorporation of the Gentle Beam enables top-surface imaging of a specimen at very low energies of several hundred eV.
JEOL JEOL ARM200F
JEM-ARM200F ACCELARM is an Atomic Resolution Analytical Electron Microscope, which boasts an unprecedented STEM-HAADF resolution of 78 pm with a STEM Cs corrector incorporated as standard.
The LUME covers the main techniques of electron microscopy, from scanning electron microscopy (SEM) to scanning transmission electron microscopy (STEM), for the characterization of the morphology and structure of materials at the micrometer and nanometer scale. In addition, it has equipment for preparing samples for analysis by different electron microscopy techniques.
