University of Michigan
Contact Info:
Owen Neill
1100 N University Ave
2005 North University Bldg
Ann Arbor, MI 48109-1005
https://sites.lsa.umich.edu/emal/
Grants and Identifiers:
RRID: RRID:SCR_026750
Instrumentation:
CAMECA SX100 Electron Probe Microanalyzer
Fully automated instrument used for nondestructive, in-situ, micro-scale elemental characterization. It is generally equipped with five vertical crystal spectrometers (WDS) and an energy dispersive analyzer (EDS), operating via proprietary Windows-based Peak Sight software or updated with third-party software like Probe for EPMA. [Product Link]
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JEOL JSM-7800F Field Emission Scanning Electron Microscope
Ultra-high-resolution, Schottky field-emission scanning electron microscope (FE-SEM) designed for advanced nano-characterization, combining in-lens technology with a super hybrid lens to achieve 0.8 nm resolution. It is utilized for high-resolution imaging, elemental analysis (EDS/WDS), and crystallographic analysis (EBSD) of materials, magnetic samples, and non-conductive specimens, even at very low voltages (down to 10 V). [Product Link]
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Rigaku SmartLab diffractometer
Automated multipurpose X-Ray diffractometer with guidance software. Power diffraction, thin film metrology, SAXS, in plane scattering, and operando measurements. [Product Link]
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Rigaku Ultima IV diffractometer
Automated multipurpose diffractometer. Powder diffraction, thin film diffraction, SAXS, pole figure, and residual stress and in plane experiments. [Product Link]
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(Equipment No Longer Active At this Facility)
CAMECA CAMECA SX100 Electron Probe Microanalyzer
Electron Probe Microanalyzer
(Equipment No Longer Active At this Facility)
CAMECA SX100 Electron Probe Microanalyzer
Electron Probe Microanalyzer
(Equipment No Longer Active At this Facility)
JEOL JSM-7800F Field Emission Scanning Electron Microscope (SEM)
Field-Emission Scanning Electron Microscope (SEM)
Services Provided:
EDS - Energy Dispersive X-ray Spectrometry
Powder X-Ray Diffraction (PXRD)
WDS - Wavelength-Dispersive X-ray Spectrometry
X-ray Diffraction And Scattering
Relevant Publications:
Description:
EMAL is part of University of Michigan’s School of Earth and Environmental Sciences. Houses CAMECA SX100 electron microprobes, Rigaku X-ray diffractometers, and JEOL JSM-7800FLV field-emission scanning electron microscope. These instruments are used by researchers for chemical and structural characterization of solid materials.
