Drexel University
Contact Info:
Craig Johnson
3126 Market Street
Bossone Building, Room 106
Philadelphia, PA 19104
https://drexel.edu/core-facilities/facilities/material-characterization/
Grants and Identifiers:
RRID: RRID:SCR_022684
Instrumentation:
JEOL 2100F Transmission Electron Microscope
JEM-2100F is a multipurpose, 200 kV FE (Field Emission) analytical electron microscope. Variety of versions is provided to adapt user's purposes. The FE electron gun (FEG) produces highly stable and bright electron probe that is never achieved with conventional thermionic electron gun. This feature is essential for ultrahigh resolution in scanning transmission microscopy and in an analysis of a nano-scaled sample. Various analytical instruments and/or cameras such as EDS (Energy Dispersive X-ray Spectrometer) or EELS (electron energy loss spectrometer) or CCD cameras are ready for integration with a PC system of the microscope control. [Product Link]
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Rigaku SmartLab diffractometer
Automated multipurpose X-Ray diffractometer with guidance software. Power diffraction, thin film metrology, SAXS, in plane scattering, and operando measurements. [Product Link]
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FEI DB235 focused ion beam scanning electron microscope
The FEI DB235 focused ion beam SEM allows high-resolution gallium ion milling of samples. Attached Omniprobe nanomanipulator and Pt metal deposition allow lift out preparation of TEM samples. The iXRF X-ray fluorescence detector allow for EDS and XRF analysis.
JEOL 2100 Transmission Electron Microscope
he JEOL 2100 TEM is the workhorse tool for imaging, diffraction and high-resolution. The TEM is equipped with a LaB6 electron source and high-resolution (0.2nm) objective lens.
Rigaku Miniflex X-ray diffractometer
The Rigaku MiniFlex 600 benchtop XRD allows fast and reliable diffraction measurements powder samples. Equipped with a 0.6kW generator, Cu normal focus X-ray, scintillation counter detector, variable slits, goniometer radius of 150mm and scanning range of -3 to 145 degrees and air-tight sample holder for ambient-free measurements.
Thermo Fisher Apreo 2S Lo Vac Scanning Electron Microscope
The Apreo 2 S is a high-resolution scanning electron microscope (SEM) optimized for in situ and in operando imaging and analysis. Capabilities include secondary electron imaging, backscattered electron imaging, integrated energy dispersive spectroscopy (EDS), electron backscattered diffraction (EBSD), inert gas transfer. In situ stages for mechanical testing (tensile, 3 & 4 point bending), heating, cooling, cryo & electrochemistry testing.
Other Equipment
Physical Electronics VersaProbe 5000 X-ray photoelectron spectrometer Zeiss Supra 50VP field-emission scanning electron microscope FEI Strata DB235 focused ion beam scanning electron microscope Rigaku Miniflex X-ray diffractometer MTS XP Nanoindenter Thermionics VE 90 thermal evaporator
Services Provided:
Data Analysis And Interpretation
Data Processing And Interpretation
Shared Instrumentation Oversight & Maintenance
Transmission Electron Microscopy
X-ray Diffraction and Scattering
Relevant Publications:
Description:
The Materials Characterization Core (MCC) at Drexel University is a multi-user facility that provides technical expertise and instrumentation for research in variety of areas including nanoscience and engineering, polymer research, biomedical engineering, and chemistry and physics of solid materials. The MCC occupies a 3,500 square foot laboratory in the Bossone Research Enterprise Building on Drexel\'s main campus that houses several electron microscopes, X-ray diffractometers, an X-ray photoelectron spectrometer and a suite of sample preparation tools. The instruments are supported by three full-time Ph.D.-level staff members who provide expert consultation, training and assistance to MCC users. In addition to serving the research missions of our users, the MCC is used for teaching both undergraduate and graduate level courses in Materials Science and Engineering, Mechanical Engineering and Mechanics, Biomedical Engineering, and Biology. MCC instrumentation and staff assistance is available to all Drexel University students, faculty and staff as well as external academic and commercial interests. Trained and certified users are welcome to work independently on our instruments 24 hours per day, 7 days per week.
